OFERTA FORMATIVA DCM - FCT/UNL
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X-ray diffraction - PANalytical XPert PRO
Description: With the X-ray diffractometer (PANalytical's X'Pert PRO MRD) available at CENIMAT-I3N, patterns can be obtained in the following configurations:
* The standard diffraction geometry of Bragg-Brentano is possible, where lattice planes are measured that are parallel to the sample surface. Diffraction angle can be as low as 5º.
* In Grazing incidence X-ray diffraction (GIXRD), it can be confined that most of (or all of) the incident X-ray beam is within the samples such as thin film. This is possible because the penetration depth is significantly reduced due to the low angle of incidence of the X-rays.
* Micro-diffraction analysis is available to investigate a small sample or a selected spot on a sample. With the available hardware, it is possible to produce an incident X-ray beam with a diameter of 100 µm.
* Non-ambient diffraction is possible to get information about the changes in the sample as a function of temperature (from room temperature to 1200ºC). In future, chemical reactions with the gas phase can be measured in situ that gives direct information about reaction kinetics.
* Source of X-rays is Cu K-alpha (wavelength 1.540598 Å)
