OFERTA FORMATIVA DCM - FCT/UNL
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Agilent 4155C semiconductor parameter analyzer + Everbeing C-2 Mini manual probe station
Location: Electrical Characterization Lab
Responsible: Pedro Barquinha / Asal Kiazadeh
Description:
Setup for I-V and time dependent measurements in substrates up to 2”, at room temperature, with dark box enclosure.
Specifications:
- 4x Source-Monitor Units (SMUs), 2x Voltage-Monitor Units (VMUs) and 2x Voltage-Source Units (VSUs). Range up to 100 V / 0.1 A
- Sweep, constant and sampling mode I and V stimulus
- 4 manual micromanipulators with triaxial cabling (sub-pA measurement capability)
- Keysight Desktop EasyExpert software for data acquisition and analysis
Responsible: Pedro Barquinha / Asal Kiazadeh
Description:
Setup for I-V and time dependent measurements in substrates up to 2”, at room temperature, with dark box enclosure.
Specifications:
- 4x Source-Monitor Units (SMUs), 2x Voltage-Monitor Units (VMUs) and 2x Voltage-Source Units (VSUs). Range up to 100 V / 0.1 A
- Sweep, constant and sampling mode I and V stimulus
- 4 manual micromanipulators with triaxial cabling (sub-pA measurement capability)
- Keysight Desktop EasyExpert software for data acquisition and analysis
