X-ray diffraction – PANalytical Xpert PRO

Location: characterization lab
Responsibles: Sónia Pereira (sp@uninova.pt) and Joana Pinto (jdvp@fct.unl.pt)
FLYER here
 
Description:
With the X-ray diffractometer (PANalytical Xpert PRO MRD) available at CENIMAT-I3N, patterns can be obtained in the following configurations:
The standard diffraction geometry of Bragg-Brentano is possible, where lattice planes are measured that are parallel to the sample surface. Diffraction angle can be low as 50.
In Grazing incidence X-ray diffraction (GIXRD), it can be confined that most of (or all of) the incident X-ray beam is within the samples such as thin film. This is possible because the penetration depth is significantly reduced due to the low angle of incidence of the X-rays.
Micro-diffraction analysis is available to investigate small sample or selected spot on a sample. With the available hardware, it is possible to produce an incident X-ray beam with a diameter of 100 µm.
Non-ambient diffraction is possible to get information about the changes in the sample as a function of temperature (from room temperature to 12000C). In future, chemical reactions with the gas phase can be measured in situ that gives direct information about reaction kinetics.
Source of X-rays is Cu K-alpha (wavelength 1.540598 Å)