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Situ conductance measurements
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b Deuermeier J a
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Wardenga HF b
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Morasch J b
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c Siol S b
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Nandy S a
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Calmeiro T a
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Martins R a
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Klein A b
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Fortunato E a
. 2016.
Highly conductive grain boundaries in copper oxide thin films
.
Journal of Applied Physics. 119
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Materials for Electronics, Optoelectronics and Nanotechnologies (MEON)
Soft and Biofunctional Materials Group (SBMG)
Structural Materials (SM)