Log in
Links
Contacts
About us
Intellectual Property
Jobs/Fellows
Lab Facilities
People
Publications
Press
Recent Projects
Services
OFERTA FORMATIVA DCM - FCT/UNL
Navigation
Biblio
Authors
Keywords
Gerir Ficheiros
ยป
Home
List
Filter
Biblio
Export 1 results:
RTF
Tagged
XML
BibTex
Sort by:
Author
[
Title
]
Type
Year
Filters:
Author
is
Barquinha, P.M.C.b
[Clear All Filters]
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
T
Niang KM a
,
Barquinha PMC b
,
Martins RFP b
,
Cobb B c
,
Powell MJ d
,
Flewitt AJ a
. 2016.
A thermalization energy analysis of the threshold voltage shift in amorphous indium gallium zinc oxide thin film transistors under positive gate bias stress
.
Applied Physics Letters. 108
Abstract
RTF
Tagged
XML
BibTex
Google Scholar
List
Filter
R&D - ID TEAMS
Materials for Electronics, Optoelectronics and Nanotechnologies (MEON)
Soft and Biofunctional Materials Group (SBMG)
Structural Materials (SM)