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Jin JW a
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Nathan A b
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Barquinha P c
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Pereira L c
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Fortunato E c
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Martins R c
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Cobb B d
. 2016.
Interpreting anomalies observed in oxide semiconductor TFTs under negative and positive bias stress
.
AIP Advances. 6
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Materials for Electronics, Optoelectronics and Nanotechnologies (MEON)
Soft and Biofunctional Materials Group (SBMG)
Structural Materials (SM)