<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Faliya, K.a</style></author><author><style face="normal" font="default" size="100%">Kliem, H.a</style></author><author><style face="normal" font="default" size="100%">Dias, C.J.b</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Investigations of space charge distributions by atomic force microscope</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings of the 2016 IEEE International Conference on Dielectrics, ICD 2016</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">Atomic force microscopy</style></keyword><keyword><style  face="normal" font="default" size="100%">Charge distribution</style></keyword><keyword><style  face="normal" font="default" size="100%">Dielectric materials</style></keyword><keyword><style  face="normal" font="default" size="100%">Electric field distributions</style></keyword><keyword><style  face="normal" font="default" size="100%">Electric fields</style></keyword><keyword><style  face="normal" font="default" size="100%">Electric space charge</style></keyword><keyword><style  face="normal" font="default" size="100%">Kelvin probe force microscopy</style></keyword><keyword><style  face="normal" font="default" size="100%">Noise pollution</style></keyword><keyword><style  face="normal" font="default" size="100%">Noise problems</style></keyword><keyword><style  face="normal" font="default" size="100%">Poisson equation</style></keyword><keyword><style  face="normal" font="default" size="100%">Surface potential measurements</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2016</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">https://www.scopus.com/inward/record.uri?eid=2-s2.0-84987851319&amp;doi=10.1109%2fICD.2016.7547584&amp;partnerID=40&amp;md5=05dd447561014ccc6d3a9e0308f8f78c</style></url></web-urls></urls><publisher><style face="normal" font="default" size="100%">Institute of Electrical and Electronics Engineers Inc.</style></publisher><volume><style face="normal" font="default" size="100%">1</style></volume><pages><style face="normal" font="default" size="100%">219-222</style></pages><isbn><style face="normal" font="default" size="100%">9781509028023</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">The requirement of the investigation of the space charge distribution in dielectric materials with less than one micrometer resolution draws the attention on the use of the atomic force microscope. The surface potential measurement by the Kelvin Probe Force Microscopy (KPFM) enables to calculate the space charges by solving Poisson equation for electrostatics. To overcome the noise problem in experimental data, a proper smoothing and derivative procedure has been developed to find the space charge and the electric field distribution. © 2016 IEEE.</style></abstract><notes><style face="normal" font="default" size="100%">cited By 0; Conference of 1st IEEE International Conference on Dielectrics, ICD 2016 ; Conference Date: 3 July 2016 Through 7 July 2016; Conference Code:123433</style></notes></record></records></xml>